特性和優(yōu)點(diǎn)

• 出色的電子性能

• 高探頭帶寬

• 快速探頭上升時(shí)間

• 出色的信號保真度

• ≤0.8 pF 輸入電容

• 40 k? 輸入電阻

• -4 V 至 +4 V 輸入動態(tài)范圍

• -10 V 至 +10 VDC 輸入偏置范圍

• ±30 V（直流 + 峰值交流）輸入電壓（非破壞）

• 全面的機(jī)械性能

• 用于探測小型幾何電路元件的緊湊型探頭頭部

• 可使用 DUT 附屬附件連接到小至 0.5 毫米針腳的 SMD

• *的可靠性設(shè)計(jì)

• 易用

• 直接連接到具有 TekVPI™ 探頭接口的示波器

• 在示波器畫面上實(shí)現(xiàn)自動單位縮放和讀數(shù)

• 輕松訪問示波器探頭菜單畫面以了解探頭狀態(tài)/診斷信息和控制探頭直流偏置

• 通過示波器實(shí)現(xiàn)遠(yuǎn)程 GPIB/USB 探頭控制

應(yīng)用

• 高速設(shè)計(jì)的驗(yàn)證、調(diào)試和檢定

• 信號完整性、抖動和定時(shí)分析

• 制造工程和測試

• 信號的電壓擺幅高達(dá) 8 Vpk-pk

為應(yīng)用選擇合適的探頭是在測量中取得信號保真度的關(guān)鍵。有源探頭為高頻測量提供了更真實(shí)的信號復(fù)制和保真度。通過超低輸入電容和的接口，TAP2500 和 TAP3500 單端有源 FET 探頭提供了當(dāng)今數(shù)字系統(tǒng)設(shè)計(jì)所需要的高速電子和機(jī)械性能。

TAP2500 和 TAP3500 有源 FET 探頭經(jīng)過專門設(shè)計(jì)，可使用并直接連接到帶有 TekVPI™ 探頭接口的示波器，通過解決以下三個(gè)傳統(tǒng)問題來實(shí)現(xiàn)高速信號采集和測量保真度：

• 通過 ≤0.8 pF 輸入電容和 40 k? 輸入阻抗降低 DUT 負(fù)載效應(yīng)

• 利用多功能 DUT 連接可連接到小型 SMD

• 在探頭端部為高達(dá) 3.5 GHz 的示波器保留儀器帶寬

Features and benefits

Excellent electronic performance

High probe bandwidth

Fast probe rise time

Excellent signal fidelity

Input capacitance 0.8pf

40 k ? input resistance

-4v to + 4v input dynamic range

-10v to + 10vdc input bias range

Maximum input voltage (non-destructive)

Overall mechanical properties

Compact probe head for detecting small geometric circuit elements

The DUT attachment can be used to connect to SMD pins as small as 0.5 mm

Strong reliability design

Easy to use

Directly connected to a TekVPI ™ oscilloscope probe interface

Realize automatic unit scaling and reading on oscilloscope screen

Easy access to the oscilloscope probe menu screen for probe status/diagnostic information and to control probe dc bias

Remote GPIB/USB probe control is realized through oscilloscope

application

Verification, debugging and verification of high-speed design

Signal integrity, jitter, and timing analysis

Manufacturing engineering and testing

The signal's voltage swing is up to 8 vpk-pk

Selecting the right probe for the application is the key to obtain the best signal fidelity in measurement. Active probe provides more real signal replication and fidelity for high frequency measurement. The TAP2500 and TAP3500 single-ended active FET probes provide the superior high-speed electrical and mechanical properties required for today's digital system designs through ultra-low input capacitors and unique interfaces.

TAP2500 and TAP3500 active FET probe specially designed, can be used and connected directly to the with TekVPI ™ oscilloscope probe interface, by solving the problem of the following three traditional fidelity of high-speed signal acquisition and measurement:

By 0.8 pF input capacitance and 40 k or less loading ? input impedance to reduce the DUT

Connect to a small SMD using a multifunctional DUT connection

The instrument bandwidth is reserved for an oscilloscope up to 3.5ghz at the end of the probe