主要特點(diǎn)及優(yōu)點(diǎn)附件/模塊應(yīng)用

在封裝或主動(dòng)溫度控制之前簡(jiǎn)化了激光二極管LIV測(cè)試

芯片(chip)或棒料(bar) 階段的激光二極管LIV生產(chǎn)測(cè)試的綜合解決方案

可通過(guò)編程將掃描（sweep）停在光功率極限上

針對(duì)脈沖與DC測(cè)試的高精度源與測(cè)量性能的結(jié)合

基于同步DSP的測(cè)量通道確保了高精度的光強(qiáng)度與電壓測(cè)量

脈寬從 500ns～5ms，占空比可達(dá)4%的可編程脈沖

脈沖模式電流可達(dá)5A，直流模式可達(dá)1A

三個(gè)測(cè)量通道14位的測(cè)量精度（VF、前光電二極管、后光電二極管）

測(cè)量算法增強(qiáng)了脈沖測(cè)量的信噪比

緩沖存儲(chǔ)器高達(dá)1000點(diǎn)的掃描存儲(chǔ)能力，消除了測(cè)試過(guò)程的GPIB流量，增大了測(cè)試產(chǎn)能

數(shù)字I/O binning與handling操作

IEEE-488 與 RS-232 接口

型號(hào)

The pulse laser diode test system is an integrated synchronous test system for the early testing of laser diode manufacturing process flow , especially when the proper temperature control cannot be easily achieved . In a compact semi - frame instrument , the full source and measurement functions required for the laser diode pulse test and the continuous LIV ( light - current - voltage ) test are provided . The tight synchronization between the source and the measurement ensures higher measurement accuracy and can test the minimum pulse width of 500ns .

Main features and advantages Annex / Module applications:

The laser diode LIV test is simplified before packaging or active temperature control;

A comprehensive solution for LIV production testing of laser diodes in the chip or bar stage;

Scanning can be programmed to stop on the optical power limit;

Perfect combination of high precision source and measurement performance for pulse and DC measurement;

The measurement channel based on synchronous DSP ensures high precision measurement of light intensity and voltage.

The pulse width is from 500 nm to 5 Ms, and the duty cycle is up to 4% programmable pulse.

Pulse mode current can reach 5A, DC mode can reach 1A;

The measuring accuracy of 14 bits of three measuring channels is VF, front photodiode, rear photodiode;

The signal to noise ratio (SNR) of pulse measurement is enhanced by the measurement algorithm.

The scan storage capacity of buffer memory is up to 1000 points, which eliminates the GPIB flow in the test process and increases the test capacity.

Digital I / O binning and handling operation;

Interface between IEEE-488 and RS-232;