大功率2651A 型數(shù)字源表進(jìn)一步豐富了2600A 系列產(chǎn)品。該源表專門針對(duì)大功率電子器 件的特性分析和測(cè)試而優(yōu)化設(shè)計(jì)，可幫助用戶在研發(fā)、可靠性及生產(chǎn)領(lǐng)域提高生產(chǎn)力，包 括高亮度LED、功率半導(dǎo)體、DC/DC 轉(zhuǎn)換器、電池，以及其他大功率材料、元件、模塊 和組件的特性分析和測(cè)試。

與2600A 系列產(chǎn)品的每個(gè)成員一樣，2651A 具有高靈活性、四象限電壓和電流源/負(fù)載， 組合了精密電壓和電流表。該源表可作為：

? 半導(dǎo)體特征分析儀
? 電壓或電流波形發(fā)生器
? 電壓或電流脈沖發(fā)生器
? 精密電源
? 真電流源
? 數(shù)字多用表(直流電壓，直流電流，電阻和功率，分辨率達(dá)5?位)
? 精密電子負(fù)載

主要特性：

? 源或阱：
- 2,000W脈沖功率(±40V，±50A);
- 200W直流功率(±10V@±20A、±20V@±10A、±40V@±5A)
? 方便地連接兩個(gè)單元(串聯(lián)或并聯(lián))形成±100A 或±80V 解決方案
? 1pA 分辨率，可精密測(cè)量極低的漏電流
? 1μs/點(diǎn)(1MHz)，連續(xù)18 位A/O 轉(zhuǎn)換器，精確的瞬態(tài)特性分析
? 1%至99%脈沖占空比，適用于脈寬調(diào)制(PWM)驅(qū)動(dòng)型器件和特殊驅(qū)動(dòng)類型期間的激勵(lì)
? 組合了精密電壓源、電流源、數(shù)字多用表、任意波形發(fā)生器、電壓或電流脈沖發(fā)生器及測(cè)量、電子負(fù)載及觸發(fā)控制器——多功能一體的儀器
? 包括TSP®Express 特性分析軟件、LabVIEW®驅(qū)動(dòng)，以及吉時(shí)利的Test Script Builder(測(cè)試腳本編輯器)軟件開關(guān)環(huán)境。

典型應(yīng)用：

? 功率半導(dǎo)體、HBLED 和光器件特性分析和測(cè)試
? GaN、SIC 及其他復(fù)合材料和
器件的特性分析
? 半導(dǎo)體結(jié)溫度特性分析
? 高速、高精度數(shù)字化
? 電遷移研究
? 大電流、大功率器件測(cè)試

兩種測(cè)量模式：數(shù)字化或積分

2651A 型有兩種測(cè)量模式可對(duì)瞬態(tài)和穩(wěn)態(tài)行為進(jìn)行精密地特性分析，包括快速變化的熱 效應(yīng)。每種模式均由其獨(dú)立的模/數(shù)(A/D)轉(zhuǎn)換器定義。

在數(shù)字化測(cè)量模式下，連續(xù)進(jìn)行1μs/點(diǎn)采樣，每秒可捕獲1,000,000 個(gè)讀數(shù)。其18 位 A/D 轉(zhuǎn)換器使用戶能夠精密測(cè)量瞬態(tài)特性。對(duì)于更準(zhǔn)確的測(cè)量，可利用基于22 位A/D 轉(zhuǎn) 換器的積分測(cè)量模式。全部2600A 系列儀器均具有積分測(cè)量模式。

Main features:

? source or well:

-2,000w pulse power (40V, 50A);

- 200W dc power (10V@ 20A, 20V@ 10A, 40V@ 5A)

? easily connect two units (in series or parallel) to form 100A or 80V solutions

? with 1pA resolution, extremely low leakage current can be accurately measured

? 1 s/ point (1MHz), continuous 18-bit A/O converter, accurate transient analysis

? 1% to 99% pulse duty cycle, suitable for excitation during pulse width modulation (PWM) driven devices and special drive types

? combination of precision voltage source, current source, digital multimeter, arbitrary waveform generator, voltage or current pulse generator and measurement, electronic load and trigger controller -- multi-functional instrument

, including TSP ® Express characteristics analysis software, and LabVIEW ® drive, as well as keithley Test Script Builder software switch environment (Test Script editor).

Typical applications:

? power semiconductor, HBLED and optical device characteristics analysis and testing

? GaN, SIC and other composite materials and materials

Analysis of device characteristics

? analysis of semiconductor junction temperature characteristics

? high-speed and high-precision digitalization

? electromigration studies

? testing of high-current and high-power devices

Two measurement modes: digital or integral

Type 2651A has two measurement modes for precise characterization of transient and steady-state behavior, including rapidly changing thermal effects. Each mode is defined by its own independent A/D converter.

Continuous 1 s/ point sampling in digital measurement mode can capture 1,000,000 readings per second. Its 18-bit A/D converter enables users to accurately measure transient characteristics. For more accurate measurements, an integral measurement mode based on A 22 bit A/D converter can be used. All 2600A series instruments have integral measurement mode.