德國(guó)尼克斯QNIX1500涂層測(cè)厚儀為磁性和渦流兩用測(cè)厚儀，不僅可以用來測(cè)量鋼鐵等磁性基體，還可以用來測(cè)量鋁、銅、不銹鋼等非磁性金屬表面的涂層、氧化膜、磷化膜等覆層。 德國(guó)尼克斯QNIX1500涂層測(cè)厚儀這個(gè)型號(hào)操作簡(jiǎn)單，攜帶方便，精度高，探頭和機(jī)身成90°直角設(shè)計(jì)，可滿足一些狹小空間（如管道內(nèi)壁）的測(cè)量，為廣大用戶所喜愛。德國(guó)尼克斯QNIX1500涂層測(cè)厚儀技術(shù)參數(shù)：基 體：磁性基體和非磁性基體（Fe/NFe）測(cè)量范圍：0-5000微米μm測(cè)量精度：0-50um:≤±1μm，50-1000μm:≤±1.5%讀數(shù)，1000-3000μm≤±3%*小接觸面：10×10mm*小曲率半徑：凸面：5mm，凹面：25mm*小基體厚度：Fe:0.2mm/NFe:0.05mm溫度補(bǔ)償范圍：0-60℃顯 示：LCD液晶探 頭：紅寶石固定式電 源：1×9V電池尺 寸：100×60×27mm重 量：110g特 點(diǎn)：直角設(shè)計(jì)方便測(cè)量管內(nèi)壁存 儲(chǔ)：QNix1500M記憶型可存儲(chǔ)數(shù)據(jù)數(shù)據(jù)傳輸：QNix1500M記憶型可連接計(jì)算機(jī)
The QNix® 1500 is reliable, easy to use and durable. Therefore it is the most popular coating thickness gauge for applications in the motor vehicle sector and indispensable for motor vehicle experts.
Do you produce damage reports and value appraisals and require a coating thickness gauge for the vehicle assessment? Do you value easy operation and reliable results?
If so, the QNix® 1500 is the right gauge for you.
Due to the 3-point contact, you can position the QNix® 1500 easily and safely and always receive reliable measurement results.
By means of two independent measurement probes, you instantly recognise on which basic substrate you are taking a measure. You can take coating thickness measurements on steel, iron (Fe) and non-ferrous metals (NFe) like aluminium, zinc, copper and brass.
All QNix® coating thickness gauges function according to our easy-to-use principle: position, measure and read.
Operation
Automatically turns on and off and can be operated with one hａnd Focusing on the essential
Ergonomic design: designed for continual use
Easy operation: Position - measure - read
All common languages displayable: can be used around the world
Advantages of application
3-point contact: preventstilting
Measured values, battery status, measuring unit, mode: easy to check
High-resolution LCD: easy to read even in strong sunlight
Large numbers: optimal readability
Polished ruby measuring head tip: protection of the measurement probe and the surfaces to be measured
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