Reflection High-Energy Electron Diffraction (RHEED) has become widely known as an essential method for real-time observation of crystal growth. RHEED can be used to analyze film surfaces in either a static mode for existing materials or dynamically as film growth evolves. This makes RHEED an exceptionally valuable tool for investigating structures in Molecular Beam Epitaxy (MBE).
In general, RHEED is a method for investing the structure of crystal surfaces. A high-energy electron beam(10-30KeV) is directed at the sample surface at a low incident angle(1-2°).The electrons are diffracted by the crystal structure of the sample being investigated and then projected on a fluorescent screen mounted opposite the electron gun. The characteristic pattern of the impinging electrons is a series of streaks. The distance between the streaks is an indication of the surface lattice cell size.
30KeV Electron Gun: Beam Spot Size: 90micro meter dia. Maximum Filament: 0.1mm dia. Tungsten Wire (hairpin-shaped) Wehnelt: Self Bias Focus Lens: Air Core Solenoid Coil Lens Deflection Lens: Troidal Coil Lens Axial Alignment Mechanism: Alignment for Filament and Wehnelt Insulation Voltage: DC30KV Working Pressure: <10-4Pa to 10-9Pa Max. Bakeout Temperature: 200 degrees C Mounting Flange: ICF70 Dimensions: 100mm dia. x 401mm long (501mm long with a connector inserted)
30KeV E-GUN POWER SUPPLY: Acceleration Voltage: 0 to -30KeV Constant Voltage Supply ( Ripple 0.03% Maximum) Beam Current: 0 to 160 micro ampere Filament Voltage: 0 to 5V Constant Voltage Supply (Ripple 0.05% Maximum) Filament Current: Max. 2A Deflection Lens Supply: 1A Constant Current Source(plus or minus1V) (Ripple 0.05% Maximum) Focus Lens Supply: 0 to 1.5A Constant Current Source(0 to 22V) (Ripple 0.05% Maximum) Input Power: 200V, 220V, 230V, 240V Dimensions: 480mm x 199mm x 500mm (cable +100mm) Safety Feature: High Voltage Interlock Others: RoHS-ready