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N5244A PNA-X Microwave Network Analyzer, 43.5 GHz

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Key Features and Functions

Reach for unrivaled excellence in your measurements and designs
Simplify your test stations by replacing racks and stacks of equipment
Increase productivity with the most integrated and flexible single-connection microwave test engine
Reduce test time with the world’s widest range of single-connection measurement applications
Test linear and nonlinear device characterization more accuray with the world’s best PNA-X

aximum Frequency	43.5 GHz
Dynamic Range	124 dB
Output Power	13 dBm
Trace Noise	0.002 dBrms
Number of Built-In Ports	2 or 4 ports
Harmonics	-60 dBc
Noise Floor	-111 dBm
Best Speed at 201 Point, 1 Sweep	5.5 ms
Network Analyzer Series	PNA-X Most Advanced and Flexible
Applications	S-Parameters Noise Figure Gain Compression X-Parameters Balance Measurements Pulsed RF IMD
Components	Antennas Mixers/Frequency Converters Amplifiers
Benchtop	Yes

Measuring Group Delay of Frequency Converters with Embedded LO

Measuring Power-Added Efficiency (PAE) with PNA Network Analyzers (1408-16) – Application Note

High-Accuracy Noise Figure Measurements Using the PNA-X Series Network Analyzer – App Note 1408-20

This application note discusses the unique challenges involved in minimizing noise figure.

Optimizing On-Wafer Noise Figure Measurements up to 67 GHz - Application Note

Shows a cold-source solution based on the Keysight PNA-X microwave network analyzer. When equipped with the optional source-corrected NF measurements (Option 029), the PNA-X provides accuracy.

Application of Keysight's PNA-X NVNA and X-Parameters in Power Amplifier Design

This 16-page article appeared in Microwave Journal's May 2011 issue; teaches you how to obtain actual linear and nonlinear component behavior to improve power amplifier design using Keysight's solutions.

Active Device Characterization in Pulse Operation Using the PNA/PNA-X - Application Note

This AN discusses pulsed S-parameter measurements using the PNA-X series and measurement techniques that enable power-dependent active device characterization including compression and distortion.

High Power Amplifier Measurements Using Keysight's Nonlinear Vector Network Analyzers AN 1408-19

This application note discusses the unique challenges involved in testing high-power devices using Keysight's N5242A nonlinear vector network analyzer(NVNA).

Total Analysis Environment for Modeling

Keysight IC-CAP is flexible and high-performance software that is capable of accurate device characterization, analysis, and easy measurement, and these capabilities take on importance for today's semiconductor modeling.

Evaluating X-parameter Models for Active Device Nonlinear Behavior (AN 1408-22)

This AN examines three different modeling techniques that can be used to capture nonlinear behavior in a PA: the more conventional S2D and P2D, and the more recently commercialize X-parameter model.