美國(guó)Signatone探針臺(tái)專業(yè)提供支持高低溫，RF,手動(dòng)/半自動(dòng)/全自動(dòng)測(cè)試，擁有46年的研發(fā)經(jīng)驗(yàn)，的。支持各類型晶圓測(cè)試.LCD測(cè)試，高低溫測(cè)試，微波測(cè)試，PCB測(cè)試探針臺(tái)，廣泛應(yīng)用于半導(dǎo)體，微電子，微波，超高頻，納米，光電，平板顯示，PCB測(cè)試等領(lǐng)域。兼容4，5，6，8，12英寸片徑的探針臺(tái)。

Wafer & Substrate Probe Stations & Accessories

For 4”, 6”, 8” and 12” wafer

·Stable probe station can reduce expendables used and prevent wafer scraped

·Failure Analysis, Reliability, Device characterization, Wafer Acceptance Test, Quality

Assurance and general purpose probing

·Five levels configurations to choose from Manual, Motorized, Joystick programmable, Software prog rammable and Semi-Automatic.

·Can upgrade when you need, and just upgrade in your LAB

·High performance thermal chuck system. The fastest transition times in the industry

·Coolant temperature never exceeds 20°C. Temperature ranges as high as 600°C

·Board mount chuck for mount various boards with test sockets

·Deep Sub-micron, Resolution Probe Positioner 800 TPI