Andor’s PV Inspector NIR Camera is designed to offer ultimate speed and sensitivity performance for in-line Electro- and Photoluminescence Inspection, delivering > 90% QE beyond 800 nm and incorporating Fringe Suppression Technology™ to minimize fringing effects in the NIR. The 1024 x 1024 array boasts high resolution 13 μm pixels, and benefits from negligible darkcurrent with thermoelectric cooling down to -70°C. PV Inspector offers industry highest throughput via rapid readout speeds up to 5 MHz, combined with a unique ‘dual exposure ring mode’ that allows fast exposure switching. A lockable USB 2.0 port ensures secure vibration resistant connectivity.

The enhanced NIR sensitivity and unique high speed modes of the PV Inspector enable dual exposure EL inspection at rates in excess of 1 cell per second, ideally suited for very high throughput PV inspection systems as found in stringers and cell sorters. Rapid, dual exposure imaging, allows for quantitative measurement of cells under distinct bias levels.